|The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation settings.||
JEOL JSM – 6390 LV (Low Vacum)
The Low Vacuum mode, which can be accessed by the click of a mouse, allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto stigmator, auto gun (saturation, bias and alignment), and automatic contrast and brightness.
The JSM-6390LV is easy to operate and provides user versatility for many research and diagnostic applications.
Other highlights include:
- Mechanically eucentric stage
- Fast, unattended data acquisition (with optional stage automation)
- Smart settings for common samples
- Streamlined design
- Compact footprint
- Customized toolbars for repetitive functions
- Enhanced SE imaging
- Super conical lens
- Fully automatic vacuum system
- LV secondary electron detector (option)
New features include:
- Improved low kV imaging in both high and low vacuum
- Multiple live image display (including picture in picture)
- Signal mixing
- Live, full screen image
- Video capability (.avi files)
Scanning Electron Microscopy (SEM) is a commonly used technique for imaging materials on the micro to nanometer scale. A Scanning Electron Microscope produces images by probing the sample with a beam of electrons which is focused into a spot on the sample surface. The beam is raster-scanned across the specimen. As the beam interacts with the specimen, various processes occur, including generation of secondary electrons, X-rays and re-exiting, or back scattering of some of the electrons that entered the sample. These backscattered or the secondary electrons can be used to construct an image of the surface topography; a SEM image is a plot of the relevant signal at the x,y position that the signal was generated. The X-rays generated as a result of the interaction of the electrons with the sample contain can be detected and enable an analytical technique called Energy-dispersive X-ray Spectroscopy (EDS or EDX) which is used for elemental analysis and chemical characterisation of the specimen; each element in the specimen has a unique atomic structure which results in a unique set of peaks in the EDS spectrum. Since the specimen is being hit with a beam of high-energy electrons, measures, such as gold-sputtering are taken to ensure that the sample isn’t damaged during imaging. The Low Vacuum (LV) mode in the JSM-6390LV can also be used to negate damage to uncoated samples. The Low Vacuum mode, which can be accessed by the click of a mouse, allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto stigmator, auto gun (saturation, bias and alignment), and automatic contrast and brightness.
JSM-6390LV Scanning Electron Microscope
SEM Image of carbon nanotubes