JEOL JSM – 6390 LV (Low Vacum)

The Low Vacuum mode, which can be accessed by the click of a mouse, allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto stigmator, auto gun (saturation, bias and alignment), and automatic contrast and brightness.

The JSM-6390LV is easy to operate and provides user versatility for many research and diagnostic applications.

Other highlights include:

•     Mechanically eucentric stage
•     Fast, unattended data acquisition (with optional stage automation)
•     Smart settings for common samples
•     Streamlined design
•     Compact footprint
•     Customized toolbars for repetitive functions
•     Enhanced SE imaging
•     Super conical lens
•     Fully automatic vacuum system
•     LV secondary electron detector (option)

New features include:

• Improved low kV imaging in both high and low vacuum
• Multiple live image display (including picture in picture)
• Signal mixing
• Live, full screen image
• Video capability (.avi files)

Scanning Electron Microscopy (SEM) is a commonly used technique for imaging materials on the micro to nanometer scale. A Scanning Electron Microscope produces images by probing the sample with a beam of electrons which is focused into a spot on the sample surface. The beam is raster-scanned across the specimen. As the beam interacts with the specimen, various processes occur, including generation of secondary electrons, X-rays and re-exiting, or back scattering of some of the electrons that entered the sample. These backscattered or the secondary electrons can be used to construct an image of the surface topography; a SEM image is a plot of the relevant signal at the x,y position that the signal was generated. The X-rays generated as a result of the interaction of the electrons with the sample contain can be detected and enable an analytical technique called Energy-dispersive X-ray Spectroscopy (EDS or EDX) which is used for elemental analysis and chemical characterisation of the specimen; each element in the specimen has a unique atomic structure which results in a unique set of peaks in the EDS spectrum. Since the specimen is being hit with a beam of high-energy electrons, measures, such as gold-sputtering are taken to ensure that the sample isn’t damaged during imaging. The Low Vacuum (LV) mode in the JSM-6390LV can also be used to negate damage to uncoated samples. The Low Vacuum mode, which can be accessed by the click of a mouse, allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The specimen chamber can accommodate a specimen of up to 6-inches in diameter. Standard automated features include auto focus/auto stigmator, auto gun (saturation, bias and alignment), and automatic contrast and brightness.

JSM-6390LV Scanning Electron Microscope

SEM Image of carbon nanotubes

Relevant Links
SEM on Wikipedia
SEM on the Museum of Science
JEOL JSM 6390LV