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Atomic Force Microscope [AFM]

The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.       

Contact person:

John W. Nolan
tel. (+30) 2510462247
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It offers a unique, state-of-the-art closed-loop scan linearization system that ensures accurate measurements and noise levels approaching those of open-loop operation. Innova delivers atomic resolution with great ease and scans up to 90 microns without the need to change scanner hardware. The integrated, high-resolution color optics and programmable, motorized Z-stage make finding features and changing tips or samples fast and easy.

 

PeakForce Tapping™ is the most significant breakthrough in AFM technology since the advent of TappingMode™. By applying a precisely controlled force response curve at every pixel, PeakForce Tapping permits the use of reduced imaging forces, protecting both fragile probes and samples with no decrease in image resolution. The true power of PeakForce Tapping, however, is its ability to enable and enhance other techniques.


PeakForce QNM™ leverages the force response data of PeakForce Tapping to obtain quantitative nanomechanical information over a wide range. ScanAsyst® automates PeakForce Tapping, saving time and effort for all AFM users. PeakForce Tapping has also been integrated into several Electrical Characterization Modes, allowing users to investigate electrical properties in parallel with nanomechanical characteristics and topography.

 

Contact Mode

The original AFM mode, providing topographic imaging and a gateway to advanced techniques


Contact mode is the basis for all AFM techniques in which the probe tip is in constant physical contact with the sample surface. While the tip scans along the surface, the sample topography induces a vertical deflection of the cantilever. A feedback loop maintains this deflection at a preset load force and uses the feedback response to generate a topographic image.


Contact Mode is suitable for materials science, biological applications and basic research. It also serves as a basis for further SPM techniques that require direct tip-sample contact.

 

TappingMode 

The most popular AFM imaging mode, the backbone of specialized techniques


The development of TappingMode™ enabled researchers to image samples too fragile to withstand the lateral forces of Contact Mode and use scan speeds much higher than could be obtained in non-contact mode.


TappingMode AFM is a Bruker-patented technique that maps topography by lightly tapping the surface with an oscillating probe tip. The cantilever’s oscillation amplitude changes with sample surface topography, and the topography image is obtained by monitoring these changes and closing the z feedback loop to minimize them.


This popular AFM mode forms the basis for many advanced modes, such as Electric Force Microscopy (EFM) and Magnetic Force Microscopy (MFM).

 

Atomic Force Microscopy (AFM) was invented in the 80s, and is one of a number of scanning probe microscopes that has helped to kick-start the area of nanotechnology. A sharp tip is brought into close proximity with a specimen under consideration. As the tip approaches the surface, it is affected by some long-range electrostatic forces, and then then short-range atomic forces, which respectively attract and then repel the tip. The instrument utilises these forces to maintain a setpoint force between the sample and the tip. As the tip is scanned across the surface, a feedback mechanism monitors and maintains this force. The x, y positions, and changes needed to maintain the setpoint force at each x and y are recorded and presented to the user as the surface topology.

 

The Innova Atomic Force Microscope delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

 

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AFM image of an Arsenic Implanted Si nanoscale device for electrical characterisation of nanostructures.

 

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AFM image of an Arsenic Implanted Si nanoscale device for electrical characterisation of nanostructures.

 

 

Relevant Links

AFM on Wikipedia

AFM in Nanoscience

Innova AFM